BS PD IEC TS 62876-2-1:2018 Nanotechnology. Reliability assessment

standard by BSI Group, 09/04/2018

Full Description

BS PD IEC TS 62876-2-1:2018, which is a Technical Specification, establishes a general stabilitytesting programme to verify the stability of the performance of nanomaterials and nanoenabledphotovoltaic devices (NePV) devices. These devices are used as subassemblies forthe fabrication of photovoltaic modules through a combination with other components. Thistesting programme defines standardized degradation conditions, methodologies and dataassessment for technologies. The results of these tests define a stability under standardizeddegradation conditions for quantitative evaluation of the stability of a new technology. Theprocedures outlined in this document were designed for NePV, but can be extended to serveas a guideline for other photovoltaic technologies as well.


Cross References:
ISO 4892-2:2013
IEC 60068-2-78
ISO 4892-1
ISO 877-1
ISO 9370
IEC 60904-9
IEC 60904-1
ISO/IEC 17025
IEC 60068-2-2
IEC 60721-2-1


All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published: 09/04/2018 ISBN(s): 9780580957413 Number of Pages: 32 File Size: 1 file , 1.1 MB Product Code(s): 30348311, 30348311, 30348311