IEC 62951-6 Ed. 1.0 b:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

standard by International Electrotechnical Commission, 05/06/2019

Full Description

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Product Details

Edition: 1.0 Published: 05/06/2019 Number of Pages: 50 File Size: 1 file , 1.9 MB