IEEE C62.35-2010 IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

standard by IEEE, 08/31/2010

Full Description

Scope

This standard applies to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD), which are one type of surge protective device component (SPDC). In this document, these devices will be called ABDs. ABDs limit (clamp) transient voltages and divert transient currents. This standard containsterms, symbols and definitions, and provides test methods for verifying ratings and measuring device characteristics. Service conditions and failure mode are also provided. This standard may also apply to other silicon surge protective device components with similar V-I characteristics.

Purpose

These test methods are required to characterize the device for applications in high speed circuits and determine the effects of data loss due to crosstalk and insertion loss. Additionally, these tests will provide the designer with protection effectiveness of the component when used to protect sensitive IC components

Product Details

Published: 08/31/2010 ISBN(s): 9780738162584, 9780738162577 Number of Pages: 26 File Size: 1 file , 420 KB Product Code(s): STDSU96064