IEEE 1445-1998 IEEE Standard for Digital Test Interchange Format (DTIF)

standard by IEEE, 03/10/1999

Full Description

Scope

This standard will define the test program set data embodied in a number of ASCII files for stimulus, response, and diagnostics of digital systems for use on digital Automatic Test Systems.

Purpose

This standard will develop a definition of digital test information for digital test systems to cover UUT Model, stimulus/response, fault dictionary, probe data, and other forms of data. Any existing defacto standards will be given precedence.

Abstract

New IEEE Standard - Superseded.The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deA?ned. This information can be broadly grouped into data that deA?nes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.

Product Details

Published: 03/10/1999 ISBN(s): 0738115533, 9780738115542 Number of Pages: 108 File Size: 1 file , 890 KB Product Code(s): STDSU94715