IEEE 592-1990
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors
standard by IEEE, 02/05/1991
Full Description
Scope
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
Abstract
Revision Standard - Inactive-Withdrawn.This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.