IEEE 1545-1999 IEEE Standard for Parametric Data Log Format

standard by IEEE, 11/15/1999

Full Description

Scope

This standard will define the file and record formats for parametric test data acquired during a test operation. This standard supports and is part of the IEEE 1226 family of standards.

Purpose

The purpose of this standard is to provide a means to log parametric data so that the data can be exchanged for the purpose of analysis and historical trend reporting.

Abstract

New IEEE Standard - Inactive-Withdrawn.Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.

Product Details

Published: 11/15/1999 ISBN(s): 0738117757, 9780738117768 Number of Pages: 36 File Size: 1 file , 100 KB Product Code(s): STDWD94771