IEEE 1620-2008 IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

standard by IEEE, 12/05/2008

Full Description

Scope

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Purpose

The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.

Abstract

Revision Standard - Inactive-Reserved.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.

Product Details

Published: 12/05/2008 ISBN(s): 9780738160139, 9780738169514, 9781504469333 Number of Pages: 26 File Size: 1 file , 750 KB Redline File Size: 2 files , 1.9 MB Product Code(s): STDRES95827, STDSURL95827