ISO 14975:2000 Surface chemical analysis -- Information formats

standard by International Organization for Standardization, 12/01/2000

Full Description

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database. The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.